A new scientific article entitled “Low-Index and Thin-Film Material Characterization in the Terahertz Range via Dielectric Waveguide Evanescent-Field Interaction” has been published in the Journal of Applied Physics, Volume 140, Issue 4.
The publication was also invited for the Special Collection “Terahertz Frontiers: Quantum and Emergent Materials, Nanoscale Phenomena, Devices and Applications.”
The study introduces a dielectric-waveguide-based method for characterizing low-index materials and thin films at terahertz frequencies. By exploiting the interaction between the material under investigation and the waveguide’s evanescent field, the proposed non-contact approach enables sensitive material analysis and supports the development of compact and integrated terahertz technologies.
Congratulations to the authors:
Ashish Kumar, Hosein Rasekhmanesh, Asrin Piroutiniya, Daniel C. Gallego, Daniel Headland, Muhsin Ali, and Guillermo Carpintero.
This research received support from the European Union’s Horizon Europe research and innovation programme through the SPRINTER, TERA6G and POLYNICES projects.
Additional support was provided by the Spanish Ministry of Science, Innovation and Universities, the European Union NextGenerationEU initiative, and the Ministry for Digital Transformation and Civil Service through the UNICO I+D 5G-6G programme.
The authors also acknowledge Rogers Corporation for providing the PCB laminate samples used in the study.
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